Atomic Force Microscopy
Instrument Description
The
NT-MDT NTEGRA Prima AFM is a high-resolution, low-noise Scanning Probe Microscope
(SPM). With its integrated optics the AFM provides imaging of samples with almost
continuous zoom from the millimeter to angstrom range. There are a wide variety
of imaging techniques available including Magnetic Force Microscopy (MFM), Electric
Force Microscopy (EFM) and Adhesion Force Imaging.
The HYSITRON TRIBISCOPE® nano-indenter interfaces with the AFM to provide quantitative nanomechanical capabilities. The indenter probe can then be utilized as an AFM probe to provide in situ imaging of the test site.
The AFM produces a detailed 3-dimensional surface topography. It does so by scanning line by line across the surface of the sample with an incredibly fine probe – only 10 - 15 µm long with a radius of curvature at the tip of just 10 nm. The integrated image analysis software allows the user to analyze the surface morphology and obtain information such as surface roughness.
AFM Techniques
In air & liquid: AFM (contact + semi-contact) / Lateral Force Microscopy / Phase Imaging/ Force Modulation/ Adhesion Force Imaging/ Lithography: AFM (Force) In air only: Magnetic Force Microscopy/ Electrostatic Force Microscopy/ Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Current)
The TriboScope® allows the user to characterize the mechanical properties
of a wide variety of materials including ceramics, metals, glasses, polymers,
biomedical materials and biological samples whether they are in the form of
thin films, coatings, composites or bulk materials. The TriboScope® will
provide experimental results and quantitative data for hardness, elastic
modulus, fracture toughness, ramped and constant force scratch resistance, friction
coefficient, wear, and thin film interfacial adhesion.
Sample Requirements
• The maximum scan height for the AFM is 10 µm, therefore a sample
must be very flat – at least within the desired scanning region –
before it can be imaged.
• Ideally, samples will be no greater than 1 x 1 x 1 cm3, however it is
in theory possible to image samples larger than this.
• Samples intended for analysis via the TriboScope® NanoIndenter must
be fastened onto a steel substrate using a thin, even layer of super glue, and
will be no larger than 1 cm in height, breadth or depth.
•Please ensure you make time to discuss your requirements with the officer in charge prior to making any bookings - this is particularly important for work using the nano-indenter as an appreciation of the materials' properties are required in order to interpret the results correctly.
| For all general enquiries contact - Dr Kevin Blake |
| Email: kevin.blake@jcu.edu.au |
| Phone: (07) 47 81 4864 |
| Fax: (07) 47 81 5550 |
