-
Future Students
Courses
-
Current Students
You and Your CourseOpportunities
-
Research and Teaching
Our ResearchResearch Degrees
-
Partners and Community
-
Information For
-
Information About
-
Analytical Facilities
-
Services and Resources
-
Resources and Extras
- Element-to-stoichiometric oxide conversion factors
- Gunshot residue (GSR)
- FAQ ICP
- Routine geochemical element analysis @ AAC
- FAQ Organic
- SEM images of local insects – N.Queensland
- False coloured images
- Notes on sample preparation of biological material for SEM
- Routine XRF element analysis @ AAC
- How to view/edit element maps from Jeol 8200 EPMA
- Standard ICP element analysis @ AAC
- FAQ - XRD/XRF
- Links to other Facilities
-
Resources and Extras
Advanced Analytical Centre Analytical Facilities All Instruments Advanced Analytical Centre
Advanced Analytical Centre
Atomic Force Microscopy (AFM)
No alt text
Technique in brief
An atomic force microscope (AFM) is a high-resolution, scanning microscope capable of imaging and measuring samples on the nanometer to angstrom scale. A fine probe on a cantilever is used to scan the surface of a specimen. Forces generated as the tip of the probe interacts with the surface are recorded as deflections on the cantilever. Using a wide variety of scanning modes and tip designs many different properties of a specimen can be examined including; 3-dimensional mapping of topography, phase imaging, mechanical, magnetic and electrical properties.
Instrumentation
The current AFM is a NT-MDT NTEGRA , a high-resolution, low-noise scanning probe microscope with integrated analysis software for a range of AFM applications. In addition, a Hysitron Triboscope nano-indenter interfaces with the AFM for the measurement of mechanical properties.
Applications
AFM techniques:
In air & liquid: AFM (contact + semi-contact) / Lateral Force Microscopy / Phase Imaging/ Force Modulation/ Adhesion Force Imaging/ Lithography: AFM (Force)
In air only: Magnetic Force Microscopy/ Electrostatic Force Microscopy/ Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Current)
Nano-indenter techniques:
Measurement of mechanical properties such as hardness, elastic modulus, fracture toughness, ramped and constant force scratch resistance, friction coefficient, wear, and thin film interfacial adhesion.
Sample requirements
-
The maximum scan height for the AFM is 10 µm, therefore a sample must be very flat – at least within the desired scanning region – before it can be imaged.
-
Ideally, samples will be no greater than 1 x 1 x 1 cm3, however it is in theory possible to image samples larger than this.
-
Samples intended for analysis via the TriboScope® NanoIndenter must be fastened onto a steel substrate using a thin, even layer of super glue, and will be no larger than 1 cm in height, breadth or depth.
Contact for more information/help: Shane.Askew@jcu.edu.au
