Atomic Force Microscopy (AFM)

About the Technique

An atomic force microscope (AFM) is a high-resolution, scanning microscope capable of imaging and measuring samples on the nanometer to angstrom scale. A fine probe on a cantilever is used to scan the surface of a specimen. Forces generated as the tip of the probe interacts with the surface are recorded as deflections on the cantilever. Using a wide variety of scanning modes and tip designs many different properties of a specimen can be examined including; 3-dimensional mapping of topography, phase imaging, mechanical, magnetic and electrical properties.

Current Instrumentation

The current AFM is a NT-MDT NTEGRA , a high-resolution, low-noise scanning probe microscope with integrated analysis software for a range of AFM applications.

Applications

AFM techniques:

In air & liquid: AFM (contact + semi-contact) / Lateral Force Microscopy / Phase Imaging/ Force Modulation/ Adhesion Force Imaging/ Lithography: AFM (Force)

In air only: Magnetic Force Microscopy/ Electrostatic Force Microscopy/ Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Current)

Sample requirements

• The maximum scan height for the AFM is 6 µm, therefore a sample must be very flat – at least within the desired scanning region – before it can be imaged.

• Ideally, samples will be no greater than 1 x 1 x 1 cm3

Contact for more information/help: Shane.Askew@jcu.edu.au