Advanced Analytical Centre Analytical Facilities Sample Requirements Atomic Force Microscopy
Atomic Force Microscopy
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Advanced Analytical Centre
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Analytical Facilities
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All Instruments
- X-ray Powder Diffraction (XRD)
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- Laser Scanning Confocal Microscopy (LSCM)
- Advanced Analytical Centre
- Multicollector-Inductively Coupled Plasma-Mass Spectrometer (MC-ICP-MS)
- Electron Probe Microanalyser (EPMA or Microprobe)
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- Element-to-stoichiometric oxide conversion factors
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- FAQ ICP
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- Routine XRF element analysis @ AAC
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General sample requirements
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The maximum scan height for the AFM is 10 µm, therefore a sample must be very flat – at least within the desired scanning region – before it can be imaged.
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Ideally, samples will be no greater than 1 x 1 x 1 cm3, however it is in theory possible to image samples larger than this.
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Samples intended for analysis via the TriboScope® NanoIndenter must be fastened onto a steel substrate using a thin, even layer of super glue, and will be no larger than 1 cm in height, breadth or depth.