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- Element-to-stoichiometric oxide conversion factors
- Gunshot residue (GSR)
- FAQ ICP
- Routine geochemical element analysis @ AAC
- FAQ Organic
- SEM images of local insects – N.Queensland
- False coloured images
- Notes on sample preparation of biological material for SEM
- Routine XRF element analysis @ AAC
- How to view/edit element maps from Jeol 8200 EPMA
- Standard ICP element analysis @ AAC
- FAQ - XRD/XRF
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Advanced Analytical Centre Analytical Facilities Sample Requirements Atomic Force Microscopy
Atomic Force Microscopy
General sample requirements
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The maximum scan height for the AFM is 10 µm, therefore a sample must be very flat – at least within the desired scanning region – before it can be imaged.
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Ideally, samples will be no greater than 1 x 1 x 1 cm3, however it is in theory possible to image samples larger than this.
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Samples intended for analysis via the TriboScope® NanoIndenter must be fastened onto a steel substrate using a thin, even layer of super glue, and will be no larger than 1 cm in height, breadth or depth.
