Advanced Analytical Centre Analytical Facilities Sample Requirements Atomic Force Microscopy

Atomic Force Microscopy

General sample requirements

  • The maximum scan height for the AFM is 10 µm, therefore a sample must be very flat – at least within the desired scanning region – before it can be imaged.

  • Ideally, samples will be no greater than 1 x 1 x 1 cm3, however it is in theory possible to image samples larger than this.

  • Samples intended for analysis via the TriboScope® NanoIndenter must be fastened onto a steel substrate using a thin, even layer of super glue, and will be no larger than 1 cm in height, breadth or depth.